The FEI Titan HRTEM is a state-of-art Transmission Electron Microscope designed to deliver the ultimate in performance in all operating modes (TEM and STEM included). It was delivered in 2007 with a field emission gun (FEG) operating at 80 to 300 kV and an EDAX detector for elemental analysis. It is outfitted with correcting lenses that fix certain aberrations to allow imaging at a resolution below 0.1 nanometers, roughly the size of an atom. It is also equipped with a post-column Gatan Imaging Filter (GIF) 865ER offering the capability to probe the spectroscopic properties of nano-materials with sub-eV resolution.
Important News
Spectroscopic studies of Ag Deposition on Silica published in Journal of Materials Chemistry
Analysis of InGaAs Quantum Rings properties published in Journal of Applied Physics
Thank you to all participants and contributors of the Materials Characterization School
Materials Characterization School - August 13th-17th, 2012 in Nano
Contact Information
Dr. Mourad Benamara,
Facility Director
Facility Director
Office: 479.575.7634
Titan's lab: 479-575-7642
Institute for Nanoscience & Engineering
microscopy.uark.edu
Dr. Gregory Salamo,
Institute Director
Office: 479-575-5931
nano.uark.edu