FEI XL-30 ESEM
Philips XL30 Environmental Scanning Electron
Microscope
The Philips XL30 ESEM is a field-emission source, Environmental Scanning Electron Microscope offering a wide range of operating conditions. It is suitable for the analysis of almost any type of specimen with minimum preparation. The ESEM has the unique capability to form images under controlled-pressure environment (low-vacuum or wet mode).
ZnSe nanoparticles with 10 to 20 nm diameter